The Quanta 3D Scanning Electron Microscope / Focused Ion Beam (SEM/FIB) dual-beam system provides:
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Receive, characterize, and process (low-radioactivity) radioactive samples.
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High resolution imaging (spatial resolution up to 1.2 nm) with both secondary and backscattered electrons.
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Chemical analysis at sub-micron resolution enabled the following two systems:
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High-speed Energy Dispersive X-ray Spectrometer (EDX) with input count rate up to 1.5M counts per second [Bruker Quantax Esprit Core with XFlash 7 Silicon Drift Detector]
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Wavelength dispersive X-ray spectrometer (WDS) with X-ray energy resolution as low as 40 eV. Good for light elements (C, N, O) as well as resolving X-ray peaks that are too close for EDX. [EDAX TEXS system]
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Quantitative microstructural and crystallographic analysis enabled by the EDAX Digiview and Hikari Electron Backscatter Diffraction (EBSD) detector.
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Micro-milling for characterization, TEM sample preparation, and micromechanical testing purposes, enabled by the gallium ion column, gas injection system (GIS), and omniprobe.
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In-situ mesoscale and microscale mechanical testing and heating (up to 800 ºC) experiments, enabled by FemotoTools FT-NMT04 micromechanical stage and Deban MT200 stage.
Instrument |
Internal |
External |
Government |
SEM |
$82/hr |
$200/hr |
$120/hr |
FIB surcharge* |
$34/hr |
$140/hr |
$75/hr |
In-situ testing |
$120/hr |
$310/hr |
$125/hr |
*The surcharge is applied on top of the hourly SEM fee when FIB is used.